Accelerator
schedule

DateUserBeamEnergyBeamlineSourceMore
04.12.2020Primož Pelicon35Cl5+5MeV-10° MicrobeamSputter ion source

MeV SIMS

03.12.2020Primož Pelicon35Cl7+9.9MeV-10° MicrobeamSputter ion source

MeV SIMS

02.12.2020Primož Pelicon35Cl6+7.3MeV-10° MicrobeamSputter ion source

MeV SIMS

01.12.2020Primož Pelicon35Cl5+5MeV-10° MicrobeamSputter ion source

MeV SIMS

30.11.2020Primož Pelicon35Cl4+3.2MeV-10° MicrobeamSputter ion source

MeV SIMS

27.11.2020Sabina Markelj3He1+4.2MeV, 3.3 MeV, 2.5MeV, 1.5MeV, 1MeV, 0.7MeV, 0.6MeV+10° ERDA/RBS/NRADuoplasmatron ion source

Globinsko profiliranje devterija

26.11.2020Sabina Markelj3He1+4.2MeV, 3.3 MeV, 2.5MeV, 1.5MeV, 1MeV, 0.7MeV, 0.6MeV+10° PIXE/RBSDuoplasmatron ion source


Deuterium depth profiling

25.11.2020Sabina Markelj3He1+4.2MeV, 3.3 MeV, 2.5MeV, 1.5MeV, 1MeV, 0.7MeV, 0.6MeV+10° ERDA/RBS/NRADuoplasmatron ion source

Deuterium depth profiling

24.11.2020Sabina Markelj3He1+4.2MeV, 3.3 MeV, 2.5MeV, 1.5MeV, 1MeV, 0.7MeV, 0.6MeV+10° ERDA/RBS/NRADuoplasmatron ion source

Deuterium depth profiling

23.11.2020Sabina Markelj3He1+4.2MeV, 3.3 MeV, 2.5MeV, 1.5MeV, 1MeV, 0.7MeV, 0.6MeV+10° ERDA/RBS/NRADuoplasmatron ion source

Deuterium depth profiling

20.11.2020Sabina Markelj4He1+0.7MeV+10° ERDA/RBS/NRADuoplasmatron ion source
19.11.2020Sabina Markelj4He1+0.7MeV+10° ERDA/RBS/NRADuoplasmatron ion source
18.11.2020Primož Pelicon35Cl5+5MeV-10° MicrobeamSputter ion source

MeV SIMS

17.11.2020Primož Pelicon35Cl5+5MeV-10° MicrobeamSputter ion source

MeV SIMS

16.11.2020Primož Pelicon35Cl5+5MeV-10° MicrobeamSputter ion source

MeV SIMS

13.11.2020No measurements.////
12.11.2020No measurements.////
11.11.2020No measurements.////
10.11.2020No measurements.////
09.11.2020No measurements.////
06.11.2020No measurements.////
05.11.2020No measurements.////
04.11.2020No measurements.////
03.11.2020No measurements.////
02.11.2020No measurements.////
30.10.2020No measurements.////
29.10.2020No measurements.////
28.10.2020No measurements.////
27.10.2020No measurements.////
26.10.2020No measurements.////
23.10.202035Cl1+/-10° MicrobeamSputter ion source