Accelerator
schedule

DateUserBeamEnergyBeamlineSourceMore
24.09.20201H1+3MeV/Multicusp ion source
23.09.2020Kristina Isaković1H1+3MeV-30° External beamMulticusp ion source
22.09.2020/19F1+30.5keV/Sputter ion source

Setting up fluor beam.

21.09.2020/19F1+30.5keV/Sputter ion source

Setting up fluor beam.

18.09.2020Servis1H1+//Sputter ion source
17.09.2020Servis1H1+//Sputter ion source
16.09.2020Matej Lipoglavšek19F5+9Mev - 3MeV+10° PIXE/RBSSputter ion source
15.09.2020Matej Lipoglavšek14N3+3.626MeV+10° PIXE/RBSSputter ion source
15.09.2020Matej Lipoglavšek19F5+9Mev - 3MeV+10° PIXE/RBSSputter ion source
14.09.2020Matej Lipoglavšek14N2+3.650MeV+10° PIXE/RBSSputter ion source
11.09.2020No measurements.////
10.09.2020No measurements////

No measurements.

09.09.2020No measurements////
08.09.2020No measurements////
07.09.2020No measurements////
04.09.2020No measurements////
03.09.2020/////

No measurements.

02.09.2020/////

No measurements.

01.09.2020/////

No measurements

31.08.2020/1H1+3MeV-30° External beamMulticusp ion source


 

28.08.2020Žiga Šmit1H1+3.0MeV-30° External beamMulticusp ion source

PIXE analysis of archeological items

28.08.2020Matjaž Kavčič1H1+3MeV-30° External beamMulticusp ion source

Profile measurement a cut wheat grain.

27.08.2020Matjaž Kavčič1H1+3.0MeV-30° External beamMulticusp ion source

Profile measurement a cut wheat grain.

26.08.2020Matjaž Kavčič1H1+3.0 MeV-30° External beamMulticusp ion source

Profile measurement a cut wheat grain.

25.08.2020Matjaž Kavčič1H1+3.0MeV-30° External beamMulticusp ion source

Profile measurement a cut wheat grain.

24.08.2020Sabina Markelj3He2+4.2MeV; 3.3MeV+10° ERDA/RBS/NRADuoplasmatron ion source

Deuterium depth profiling

24.08.2020Sabina Markelj3He1+2.5MeV; 1.5MeV; 1.0MeV; 0.7MeV+10° ERDA/RBS/NRADuoplasmatron ion source

Deuterium depth profiling

21.08.2020Sabina Markelj3He2+4.2MeV; 3.3MeV+10° ERDA/RBS/NRADuoplasmatron ion source

Deuterium depth profiling

 

21.08.2020Sabina Markelj3He1+2.5MeV; 1.5MeV; 1.0MeV; 0.7MeV+10° ERDA/RBS/NRADuoplasmatron ion source

Deuterium depth profiling

20.08.2020Mitja Kelemen1H1+3.0 MeV-10° MicrobeamMulticusp ion source
20.08.2020Sabina Markelj3He1+4.2MeV; 3.3MeV+10° ERDA/RBS/NRADuoplasmatron ion source

Deuterium depth profiling